发明授权
- 专利标题: Differentially pumped ion trap mass spectrometer
- 专利标题(中): 差分泵浦离子阱质谱仪
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申请号: US948394申请日: 1992-09-23
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公开(公告)号: US5268572A公开(公告)日: 1993-12-07
- 发明人: Alex Mordehai , John D. Henion
- 申请人: Alex Mordehai , John D. Henion
- 申请人地址: NY Ithaca
- 专利权人: Cornell Research Foundation, Inc.
- 当前专利权人: Cornell Research Foundation, Inc.
- 当前专利权人地址: NY Ithaca
- 主分类号: H01J49/24
- IPC分类号: H01J49/24 ; H01J49/42
摘要:
An ion trap mass spectrometer includes an ion trap region separated from an electron multiplier region by a baffle, and separate turbomolecular pumps for pumping each region to a different pressure level. The ion trap region can therefore be pumped to a higher pressure level than ca be used for the electron multiplier region, and the result and increase in pressure of damping gas in the ion trap region increases the sensitivity of the device.
公开/授权文献
- US6051794A Waterproofing member for wire harness connecting portion 公开/授权日:2000-04-18