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US5331197A Semiconductor memory device including gate electrode sandwiching a channel region 失效
半导体存储器件包括夹着沟道区的栅电极

Semiconductor memory device including gate electrode sandwiching a
channel region
摘要:
A semiconductor memory device includes: an insulated gate transistor having a plurality of main electrode regions provided along a major surface of a substrate and a channel region provided between the plurality of main electrode regions, and a gate electrode provided on the channel region with a gate insulator therebetween, the gate electrode having at least two opposing portions; and an electrically breakable memory element provided on one of the main electrode regions.
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