发明授权
- 专利标题: Method of making epitaxial wafers
- 专利标题(中): 制造外延片的方法
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申请号: US205558申请日: 1994-03-04
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公开(公告)号: US5362683A公开(公告)日: 1994-11-08
- 发明人: Takao Takenaka , Masahisa Endo , Masato Yamada
- 申请人: Takao Takenaka , Masahisa Endo , Masato Yamada
- 申请人地址: JPX Tokyo
- 专利权人: Shin-Etsu Handotai Co., Ltd.
- 当前专利权人: Shin-Etsu Handotai Co., Ltd.
- 当前专利权人地址: JPX Tokyo
- 优先权: JPX5-076341 19930310
- 主分类号: C30B19/00
- IPC分类号: C30B19/00 ; H01L21/20 ; H01L21/208 ; H01L21/304 ; H01L21/302
摘要:
To manufacture epitaxial wafers with a smaller amount of semiconductor crystals at a lower cost by means of an efficient epitaxial growth process. An epitaxial wafer is made by forming, by means of epitaxial growth, GaAlAs layers with identical structures on both sides of a GaAs substrate wafer with the crystal plane orientation of {100}. The epitaxial wafer is then divided in the GaAs substrate wafer portion into two pieces to obtain two epitaxial wafers. To perform the epitaxial growth process, a plurality of GaAs substrate wafers are held at their edges and then the GaAs substrate wafers are placed in a Ga solution at prescribed spatial intervals. To divide the epitaxial wafer in the GaAs substrate portion into two pieces, the substrate wafer portion is cut parallel to the main surface. Or, the GaAs substrate wafer can also be removed by means of etching while the epitaxial wafer is rotated at a high speed in the etching solution.
公开/授权文献
- US4818235A Isolation structures for integrated circuits 公开/授权日:1989-04-04
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