发明授权
- 专利标题: System and method of measuring high-speed electrical waveforms using force microscopy and offset sampling frequencies
- 专利标题(中): 使用力显微镜和偏移采样频率测量高速电波形的系统和方法
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申请号: US984891申请日: 1992-12-02
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公开(公告)号: US5381101A公开(公告)日: 1995-01-10
- 发明人: David M. Bloom , Francis Ho , Alfred S. Hou
- 申请人: David M. Bloom , Francis Ho , Alfred S. Hou
- 申请人地址: CA Stanford
- 专利权人: The Board of Trustees of the Leland Stanford Junior University
- 当前专利权人: The Board of Trustees of the Leland Stanford Junior University
- 当前专利权人地址: CA Stanford
- 主分类号: G01Q60/38
- IPC分类号: G01Q60/38 ; G01B5/28 ; G01B21/30 ; G01Q10/06 ; G01Q70/14
摘要:
A potentiometry apparatus for measuring a periodic electrical waveform existing proximate the surface of a sample such as a semiconductor wafer is disclosed herein. The potentiometry apparatus includes a pulse generator for generating a sequence of electrical pulses at a pulse frequency offset from the frequency of the surface waveform by a mixing frequency. A cantilever coupled to the pulse generator serves to carry the electrical pulses to a position proximate the surface of the sample. In a capacitive displacement mode the cantilever is mechanically displaced so as to generate a time-expanded representation of the electrical surface waveform having a repetition frequency equal to the mixing frequency. During displacement mode operation an optical detection circuit may be employed to monitor deflection of the cantilever. In a tunneling current mode the cantilever is again employed to carry the electrical pulses to a position proximate the surface of the sample. In this mode a tunneling current propagating through the cantilever at the mixing frequency provides a time-expanded representation of the electrical surface waveform.
公开/授权文献
- US5894710A Package squaring device 公开/授权日:1999-04-20
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