发明授权
US5392248A Circuit and method for detecting column-line shorts in
integrated-circuit memories
失效
用于检测集成电路存储器中的列线短路的电路和方法
- 专利标题： Circuit and method for detecting column-line shorts in integrated-circuit memories
- 专利标题（中）： 用于检测集成电路存储器中的列线短路的电路和方法
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申请号： US149242申请日： 1993-10-26
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公开(公告)号： US5392248A公开(公告)日： 1995-02-21
- 发明人: Phat C. Truong , Tim M. Coffman , Sung-Wei Lin , T. Damodar Reddy , Dennis R. Robinson
- 申请人： Phat C. Truong , Tim M. Coffman , Sung-Wei Lin , T. Damodar Reddy , Dennis R. Robinson
- 申请人地址： TX Dallas
- 专利权人： Texas Instruments Incorporated
- 当前专利权人： Texas Instruments Incorporated
- 当前专利权人地址： TX Dallas
- 主分类号： G11C29/02
- IPC分类号： G11C29/02 ; G11C29/18 ; G11C29/50 ; G11C7/00
摘要：
The column-line short detection circuit of this invention includes a special test circuit that turns off wordlines (15), a N-channel transistor (23) for each column line (18), a decoder (19a) that uses only the least significant column address (20d) for input to the test circuit, and a sensor (SA) to detect current between shorted column lines (18). Because the column-line short detection circuit of this invention uses only the least significant address as input for column decoder (19a), it requires a very small number of transistors.
公开/授权文献
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