发明授权
- 专利标题: High-withstand-voltage integrated circuit
- 专利标题(中): 高耐压集成电路
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申请号: US978270申请日: 1992-11-18
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公开(公告)号: US5399916A公开(公告)日: 1995-03-21
- 发明人: Tatsuhiko Fujihira , Masaharu Nishiura
- 申请人: Tatsuhiko Fujihira , Masaharu Nishiura
- 申请人地址: JPX Kawasaki
- 专利权人: Fuji Electric Co., Ltd.
- 当前专利权人: Fuji Electric Co., Ltd.
- 当前专利权人地址: JPX Kawasaki
- 优先权: JPX3-315688 19911129
- 主分类号: H01L21/822
- IPC分类号: H01L21/822 ; H01L27/02 ; H01L27/04 ; H01L27/088 ; H03K3/01
摘要:
In a high-withstand-voltage integrated circuit, several circuits are included at different potentials. Each circuit of a different potential has a power source, and interface circuits mediate signals between the circuits of different potentials. By this design, the required number of high-withstand-voltage elements is reduced, and a low-cost, high-withstand-voltage IC with high integration density, surge tolerance and stability is obtained.
公开/授权文献
- US5811351A Semiconductor device and method of manufacturing the same 公开/授权日:1998-09-22
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