发明授权
- 专利标题: X-ray monitoring system
- 专利标题(中): X射线监测系统
-
申请号: US216037申请日: 1994-03-22
-
公开(公告)号: US5428657A公开(公告)日: 1995-06-27
- 发明人: Chris D. Papanicolopoulos , J. Craig Wyvill , Wayne D. R. Daley , William R. Owens
- 申请人: Chris D. Papanicolopoulos , J. Craig Wyvill , Wayne D. R. Daley , William R. Owens
- 申请人地址: GA Atlanta
- 专利权人: Georgia Tech Research Corporation
- 当前专利权人: Georgia Tech Research Corporation
- 当前专利权人地址: GA Atlanta
- 主分类号: G01N23/20
- IPC分类号: G01N23/20 ; G01N33/12 ; G01N23/201
摘要:
The invention is a method and apparatus for identifying and pinpointing the location of unwanted pieces of material or defects in, for example, de-boned poultry pieces. The poultry pieces to be inspected are carried on a conveyor and passed under an impinging collimated X-ray beam. The Rayleigh scattering resulting is detected and measured, as is the Compton back scattering and the data is processed in a processing unit to determine the location and type of foreign matter involved. The ratio of the Rayleigh and Compton scattering is also determined and used to verify the identity of the foreign material. Transmitted X-rays, i.e., radioscopy, are used to normalize the data, and to aid in a pinpointing of the location of the unwanted material.
公开/授权文献
- US6045381A Two-layer ZIF PGA socket 公开/授权日:2000-04-04
信息查询