Invention Grant
US5442298A Method and apparatus for measuring resistivity of geometrically
undefined materials
失效
用于测量几何未定义材料的电阻率的方法和装置
- Patent Title: Method and apparatus for measuring resistivity of geometrically undefined materials
- Patent Title (中): 用于测量几何未定义材料的电阻率的方法和装置
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Application No.: US40054Application Date: 1993-03-30
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Publication No.: US5442298APublication Date: 1995-08-15
- Inventor: On-Kok Chang
- Applicant: On-Kok Chang
- Assignee: Chang; On-Kok
- Current Assignee: Chang; On-Kok
- Main IPC: G01N27/04
- IPC: G01N27/04
Abstract:
The present invention relates to an apparatus and method for measuring electrical characteristics of materials having undefined geometries in an accurate and reproducible manner. Generally speaking, electrical characteristics such as conductivity and resistance are measured by compressing the material with a predetermined force or pressure in a controlled manner to provide reproducible results.
Public/Granted literature
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