Method and apparatus for measuring resistivity of geometrically
undefined materials
    1.
    发明授权
    Method and apparatus for measuring resistivity of geometrically undefined materials 失效
    用于测量几何未定义材料的电阻率的方法和装置

    公开(公告)号:US5469069A

    公开(公告)日:1995-11-21

    申请号:US35142

    申请日:1993-03-19

    Applicant: On-Kok Chang

    Inventor: On-Kok Chang

    CPC classification number: G01R27/02 G01N27/07

    Abstract: The present invention is directed to an apparatus and method for improving the accuracy of measuring resistivity and/or conductivity of a paste. Exemplary embodiments relate to an apparatus for measuring electrical characteristics of a material. A sample of material is placed in a first charge conducting region with a first cross-sectional area and in a second charge conducting region with a second cross-sectional area, the first cross-sectional area being greater than the second cross-sectional area. Further, the apparatus conducts an electric charge through the first and second charge conducting regions via a conductive terminal located in the first charge conducting region.

    Abstract translation: 本发明涉及一种用于提高测量糊状物的电阻率和/或电导率的精度的装置和方法。 示例性实施例涉及用于测量材料的电特性的装置。 材料样品被放置在具有第一横截面积的第一电荷导电区域中,并且在具有第二横截面积的第二电荷导电区域中,第一横截面积大于第二横截面积。 此外,该装置经由位于第一充电导电区域中的导电端子经由第一和第二充电导电区域进行电荷。

    Method and apparatus for measuring resistivity of geometrically
undefined materials
    3.
    发明授权
    Method and apparatus for measuring resistivity of geometrically undefined materials 失效
    用于测量几何未定义材料的电阻率的方法和装置

    公开(公告)号:US5442298A

    公开(公告)日:1995-08-15

    申请号:US40054

    申请日:1993-03-30

    Applicant: On-Kok Chang

    Inventor: On-Kok Chang

    CPC classification number: G01N27/043

    Abstract: The present invention relates to an apparatus and method for measuring electrical characteristics of materials having undefined geometries in an accurate and reproducible manner. Generally speaking, electrical characteristics such as conductivity and resistance are measured by compressing the material with a predetermined force or pressure in a controlled manner to provide reproducible results.

    Abstract translation: 本发明涉及一种用于以精确和可再现的方式测量具有未定义几何形状的材料的电特性的装置和方法。 一般来说,通过以受控的方式以预定的力或压力压缩材料来测量诸如导电性和电阻的电特性,以提供可重复的结果。

    Sample holder for spectroscopy
    4.
    发明授权
    Sample holder for spectroscopy 失效
    光谱样品架

    公开(公告)号:US5519218A

    公开(公告)日:1996-05-21

    申请号:US101880

    申请日:1993-08-04

    Applicant: On Kok Chang

    Inventor: On Kok Chang

    CPC classification number: G01N21/01

    Abstract: There is provided a sample holder for use in radiant spectroscopy analysis. The sample holder comprises a plurality of openings defined by one or more solid, substantially opaque, structural elements, each of the openings being arranged to retain a solid, semi-solid, gel or liquid material sample in the opening. Desirably, the openings constitute at least a major portion of the combined area of the one or more structural elements and the openings. In one embodiment, the sample holder comprises a plurality of strips secured together at irregular (random) or regular intervals. Desirably, one first group of strips is disposed in parallel spaced apart relation and a second group of strips disposed in parallel relation with the groups intersecting at an angle of between 30 and 150 degrees and secured together at substantially regular intervals. The strips may be woven as in wire mesh, or non-woven as in expanded metal. In another embodiment, the sample holder is a sheet of metal having perforations. In each embodiment, the sample holder is of structural elements which are substantially solid and opaque to infrared (IR) radiation. The void spaces or openings are defined by the structural elements (i.e. wires). The void spaces retain the sample to be analyzed by spectroscopy.

    Abstract translation: 提供了用于辐射光谱分析的样品架。 样品保持器包括由一个或多个固体,基本上不透明的结构元件限定的多个开口,每个开口被布置成将固体,半固体,凝胶或液体材料样品保持在开口中。 理想地,开口构成一个或多个结构元件和开口的组合区域的至少大部分。 在一个实施例中,样品架包括以不规则(随机)或规则的间隔固定在一起的多个条。 理想地,一组第一组条带以平行间隔的关系设置,并且第二组带条以与30度至150度之间的角度相交的组平行关系设置并以基本上规则的间隔固定在一起。 条可以如丝网一样编织,或者像在金属网中的无纺织物一样编织。 在另一个实施例中,样品架是具有穿孔的金属片。 在每个实施例中,样品架具有基本上是固体的并且不透红外(IR)辐射的结构元件。 空隙空间或开口由结构元件(即导线)限定。 空隙空间通过光谱法保留待分析的样品。

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