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US5490116A Semiconductor memory device including a component having improved breakdown voltage characteristics 失效
半导体存储器件包括具有改进的击穿电压特性的部件

Semiconductor memory device including a component having improved
breakdown voltage characteristics
摘要:
In a semiconductor memory device including a boosting circuit for generating a high voltage constantly, and a word line driving circuit for transmitting a high voltage from the boosting circuit on a selected word line, a capacitor for stabilizing the high voltage generated by the boosting circuit is formed of a series of capacitive elements using a FET having a gate insulating film identical in thickness to that of a insulating gate type field effect transistor in the memory device. A voltage applied across each capacitive element is relaxed, and the capacitor is improved in dielectric breakdown voltage characteristics, to stably supply the high voltage.
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