发明授权
US5496758A Fabrication process of a semiconductor memory device having a multiple well structure in a recessed substrate 失效
在凹陷基板中具有多孔结构的半导体存储器件的制造工艺

  • 专利标题: Fabrication process of a semiconductor memory device having a multiple well structure in a recessed substrate
  • 专利标题(中): 在凹陷基板中具有多孔结构的半导体存储器件的制造工艺
  • 申请号: US355489
    申请日: 1994-12-14
  • 公开(公告)号: US5496758A
    公开(公告)日: 1996-03-05
  • 发明人: Taiji Ema
  • 申请人: Taiji Ema
  • 申请人地址: JPX Kawasaki
  • 专利权人: Fujitsu Limited
  • 当前专利权人: Fujitsu Limited
  • 当前专利权人地址: JPX Kawasaki
  • 优先权: JPX6-031611 19940301
  • 主分类号: H01L27/10
  • IPC分类号: H01L27/10 H01L21/8242 H01L27/105 H01L27/108 H01L21/70 H01L27/00
Fabrication process of a semiconductor memory device having a multiple
well structure in a recessed substrate
摘要:
A method for fabricating a semiconductor memory device includes the steps of forming, in a semiconductor substrate of a first conductivity type, a well of a second opposite conductivity type by protecting the substrate surface except for a part where the well of the second conductivity type is to be formed, oxidizing the exposed surface of the semiconductor substrate while using the same mask pattern to form a thick oxide film on the surface of the well, and removing the thick oxide film by an etching process to form a recessed surface on the well.
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