发明授权
- 专利标题: Self-aligned contact process
- 专利标题(中): 自对准接触过程
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申请号: US293140申请日: 1994-08-19
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公开(公告)号: US5500382A公开(公告)日: 1996-03-19
- 发明人: Che-Chia Wei
- 申请人: Che-Chia Wei
- 申请人地址: TX Carrollton
- 专利权人: SGS-Thomson Microelectronics, Inc.
- 当前专利权人: SGS-Thomson Microelectronics, Inc.
- 当前专利权人地址: TX Carrollton
- 主分类号: H01L21/28
- IPC分类号: H01L21/28 ; H01L21/302 ; H01L21/3065 ; H01L21/336 ; H01L21/60 ; H01L21/768 ; H01L23/522 ; H01L29/78
摘要:
A method for forming a self-aligned contact utilizes a thin insulating layer formed on the upper surface of a conductive layer. A barrier layer is deposited over the insulating layer, and gate electrodes are then defined. Sidewall spacers are formed along the vertical sidewalls of the gate electrodes. During formation of the sidewall spacers the barrier layer protects the gate electrodes. A second insulating layer is then deposited and a via is opened to the substrate. A contact can now be created by depositing conductive material into the via.
公开/授权文献
- US4882072A Method and apparatus for treating bodies of water 公开/授权日:1989-11-21
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