发明授权
US5510280A Method of making an asymmetrical MESFET having a single sidewall spacer
失效
制造具有单个侧壁间隔物的不对称MESFET的方法
- 专利标题: Method of making an asymmetrical MESFET having a single sidewall spacer
- 专利标题(中): 制造具有单个侧壁间隔物的不对称MESFET的方法
-
申请号: US74355申请日: 1993-06-10
-
公开(公告)号: US5510280A公开(公告)日: 1996-04-23
- 发明人: Minoru Noda
- 申请人: Minoru Noda
- 申请人地址: JPX Tokyo
- 专利权人: Mitsubishi Denki Kabushiki Kaisha
- 当前专利权人: Mitsubishi Denki Kabushiki Kaisha
- 当前专利权人地址: JPX Tokyo
- 优先权: JPX2-104038 19900419
- 主分类号: H01L29/812
- IPC分类号: H01L29/812 ; H01L21/285 ; H01L21/336 ; H01L21/338 ; H01L29/08 ; H01L29/423
摘要:
A field effect transistor having an asymmetric gate includes high dopant concentration source and drain regions. The drain region is shallower and of lower dopant concentration than the source region. The drain is spaced from the gate electrode. Therefore, an ideal FET having a reduced short channel effect and having a lower source resistance and high current drivability (gm) is obtained. When the drain region is produced by ion implantation through a film and the source region is produced by the implantation directly into the substrate, only the drain region is separated from the gate. When the insulating film on the source region is separated from the insulating film on the drain region, the insulating film on the source region is reliably selectively removed, whereby high controllability is obtained.
公开/授权文献
- USD398892S Tire tread 公开/授权日:1998-09-29
信息查询
IPC分类: