发明授权
US5516886A Metal ion reduction in top anti-reflective coatings for photoresists
失效
用于光致抗蚀剂的顶部抗反射涂层中的金属离子还原
- 专利标题: Metal ion reduction in top anti-reflective coatings for photoresists
- 专利标题(中): 用于光致抗蚀剂的顶部抗反射涂层中的金属离子还原
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申请号: US258898申请日: 1994-06-10
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公开(公告)号: US5516886A公开(公告)日: 1996-05-14
- 发明人: M. Dalil Rahman , Dana L. Durham
- 申请人: M. Dalil Rahman , Dana L. Durham
- 申请人地址: NJ Somerville
- 专利权人: Hoechst Celanese Corporation
- 当前专利权人: Hoechst Celanese Corporation
- 当前专利权人地址: NJ Somerville
- 主分类号: G03F7/09
- IPC分类号: G03F7/09 ; G03F7/11 ; H01L21/027 ; C08F6/06 ; C08J7/00 ; G03C1/00
摘要:
The present invention provides methods for producing top anti-reflective coating compositions having a very low level of metal ions, utilizing specially treated ion exchange resins. A method is also provided for producing semiconductor devices using such top anti-reflective coating compositions.
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