- 专利标题: Semiconductor integrated circuit device with data output circuit
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申请号: US561064申请日: 1995-11-22
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公开(公告)号: US5570038A公开(公告)日: 1996-10-29
- 发明人: Eiichi Makino , Masaru Koyanagi
- 申请人: Eiichi Makino , Masaru Koyanagi
- 申请人地址: JPX Tokyo
- 专利权人: Kabushiki Kaisha Toshiba
- 当前专利权人: Kabushiki Kaisha Toshiba
- 当前专利权人地址: JPX Tokyo
- 优先权: JPX5-136867 19930515; JPX6-85074 19940422
- 主分类号: G05F1/56
- IPC分类号: G05F1/56 ; G05F3/24 ; G11C11/401 ; G11C11/407 ; G11C11/409 ; H03K19/00 ; H03K19/003
摘要:
The control voltage .phi.1 outputted by the control voltage generating circuit 1 is at a low level in a range where an external supply voltage Vcc is lower than the threshold value of the transistor P1, but increases continuously in analog manner when the external supply voltage Vcc rises. After having matched the external supply voltage Vcc, the control voltage .phi.1 increases in the same way as the external supply voltage Vcc. By use of the control voltage provided with the characteristics as described above for an output circuit, controlled is the gate of a transistor P4 of a low-voltage operating output section 6 operative only at a voltage lower than a predetermined value. The transistor P2 of a full-voltage operating output section 5 of the output circuit is always operative on the basis of the control signal .phi.H of the data output control circuit 3. When the external supply voltage is low below the predetermined value, the transistor P4 is perfectly turned on, so that the conductance thereof increases. In the semiconductor integrated circuit device operative on the basis of a plurality of supply voltages, it is possible to prevent the operation margin from being reduced near the switching point of the gate voltages of the driving transistors and the data output transistors.
公开/授权文献
- US3987666A Device for remote inspection and testing of a structure 公开/授权日:1976-10-26
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