发明授权
- 专利标题： LCD panel test system
- 专利标题（中）： 液晶面板测试系统
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申请号： US590594申请日： 1996-01-24
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公开(公告)号： US5689341A公开(公告)日： 1997-11-18
- 发明人: Masaki Hayashi
- 申请人： Masaki Hayashi
- 申请人地址： JPX Tokyo
- 专利权人： Advantest Corp.
- 当前专利权人： Advantest Corp.
- 当前专利权人地址： JPX Tokyo
- 优先权： JPX7-027434 19950124
- 主分类号： G01R31/00
- IPC分类号： G01R31/00 ; G01M11/00 ; G02F1/13 ; G03B15/00 ; G01N21/25
摘要：
A LCD test system is able to adjust the differences in focal point lengths caused by chromatic aberration without increasing the size of the camera system and its manufacturing cost. In addition to the conventional structure, the parallel plates are inserted in the pockets of the rotation plate along with each of the four types of optical filters such as red, green, blue and transparency. Therefore, the differences in the focal point lengths due to the chromatic aberration are adjusted without increasing the size of the camera system and its manufacturing cost drastically.
公开/授权文献
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