发明授权
US5706212A Infrared ellipsometer/polarimeter system, method of calibration, and use
thereof
失效
红外椭偏仪/偏振计系统,校准方法及其应用
- 专利标题: Infrared ellipsometer/polarimeter system, method of calibration, and use thereof
- 专利标题(中): 红外椭偏仪/偏振计系统,校准方法及其应用
-
申请号: US618820申请日: 1996-03-20
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公开(公告)号: US5706212A公开(公告)日: 1998-01-06
- 发明人: Daniel W. Thompson , Blaine D. Johs
- 申请人: Daniel W. Thompson , Blaine D. Johs
- 申请人地址: NE Lincoln NE Lincoln
- 专利权人: Board of Regents of University of Nebraska,J.A. Woollam Co. Inc.
- 当前专利权人: Board of Regents of University of Nebraska,J.A. Woollam Co. Inc.
- 当前专利权人地址: NE Lincoln NE Lincoln
- 主分类号: G01J3/28
- IPC分类号: G01J3/28 ; G01J4/00 ; G01N21/21 ; G01J3/447
摘要:
A sample system investigation system, such as an ellipsometer or polarimeter system, for use in investigating sample systems with electromagnetic wavelengths in the infrared range, and a calibration method for compensating nonidealities in multi-dimensional system rotated and non-rotated component representing matricies, are disclosed. An essentially achromatic compensator of dual-rhomb construction, which introduces a (3*LAMBDA/4) phase shift, but essentially no deviation in the direction of propagation of a polarized beam of electromagnetic wavelengths caused to pass therethrough, even when said compensator is caused to continuously rotate, is also disclosed.
公开/授权文献
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