发明授权
US5706212A Infrared ellipsometer/polarimeter system, method of calibration, and use thereof 失效
红外椭偏仪/偏振计系统,校准方法及其应用

Infrared ellipsometer/polarimeter system, method of calibration, and use
thereof
摘要:
A sample system investigation system, such as an ellipsometer or polarimeter system, for use in investigating sample systems with electromagnetic wavelengths in the infrared range, and a calibration method for compensating nonidealities in multi-dimensional system rotated and non-rotated component representing matricies, are disclosed. An essentially achromatic compensator of dual-rhomb construction, which introduces a (3*LAMBDA/4) phase shift, but essentially no deviation in the direction of propagation of a polarized beam of electromagnetic wavelengths caused to pass therethrough, even when said compensator is caused to continuously rotate, is also disclosed.
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