发明授权
US5711812A Apparatus for obtaining dose uniformity in plasma doping (PLAD) ion
implantation processes
失效
用于获得等离子体掺杂(PLAD)离子注入工艺中的剂量均匀性的装置
- 专利标题: Apparatus for obtaining dose uniformity in plasma doping (PLAD) ion implantation processes
- 专利标题(中): 用于获得等离子体掺杂(PLAD)离子注入工艺中的剂量均匀性的装置
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申请号: US469401申请日: 1995-06-06
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公开(公告)号: US5711812A公开(公告)日: 1998-01-27
- 发明人: David LeRoy Chapek , Susan Benjamin Felch , Michael William Kissick , Shamim Muhammad Malik , Tienyu Terry Sheng
- 申请人: David LeRoy Chapek , Susan Benjamin Felch , Michael William Kissick , Shamim Muhammad Malik , Tienyu Terry Sheng
- 申请人地址: CA Palo Alto
- 专利权人: Varian Associates, Inc.
- 当前专利权人: Varian Associates, Inc.
- 当前专利权人地址: CA Palo Alto
- 主分类号: H01J37/317
- IPC分类号: H01J37/317 ; C23C14/48 ; H01J37/32 ; H01L21/22 ; H01L21/265 ; C23C16/00
摘要:
An apparatus for improving dose uniformity in the PLAsma Doping (PLAD) ion implantation of a target material is described. By providing means for simultaneously biasing both the electrode, upon which the target is disposed, and a separately biasable concentric structure introduced about the electrode and sufficiently close to the target, together with means for adjustable bias variation between the electrode and the structure one can sufficiently adjust the shape of the implantation plasma, e.g. induced electric field and plasma sheath thickness, in order to effectively provide a uniform dose distribution during PLAD ion implantation processes.
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