发明授权
- 专利标题: Method and apparatus for zone-melting recrystallization of semiconductor layer
- 专利标题(中): 半导体层区域熔融再结晶的方法和装置
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申请号: US524776申请日: 1995-09-07
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公开(公告)号: US5741359A公开(公告)日: 1998-04-21
- 发明人: Takashi Motoda , Manabu Kato
- 申请人: Takashi Motoda , Manabu Kato
- 申请人地址: JPX Tokyo
- 专利权人: Mitsubishi Denki Kabushiki Kaisha
- 当前专利权人: Mitsubishi Denki Kabushiki Kaisha
- 当前专利权人地址: JPX Tokyo
- 优先权: JPX6-214567 19940908
- 主分类号: H01L21/20
- IPC分类号: H01L21/20 ; C30B13/16 ; C30B13/22 ; H01L21/02 ; H01L21/336 ; H01L27/12 ; H01L29/786 ; C30B13/06
摘要:
An apparatus for zone-melting recrystallization of a semiconductor layer includes a first heater, on which a semiconductor wafer including the semiconductor layer and upper and lower insulating films sandwiching the semiconductor layer is mounted, for radiantly heating a rear surface of the semiconductor wafer to a temperature at which the semiconductor layer and the insulating layers are not melted; and a second heater disposed above the semiconductor wafer and radiantly heating a front surface of the semiconductor wafer. The second heater has a heat generating point that produces a heated spot in the semiconductor layer and moves spirally while maintaining a fixed distance from the semiconductor wafer, thereby producing a large-area monocrystalline region in the semiconductor layer. In this zone-melting recrystallization, a single crystalline nucleus is produced in the semiconductor layer, and the entire semiconductor layer is recrystallized with the crystalline nucleus as a seed crystal. Therefore, the semiconductor layer is recrystallized with the same crystal structure and orientation as the crystalline nucleus, so that grain boundaries are reduced, resulting in a semiconductor layer with increased grain size.
公开/授权文献
- US4535446A Digital transmission systems 公开/授权日:1985-08-13
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