发明授权
- 专利标题: Semiconductor memory device with program/erase verification
- 专利标题(中): 具有编程/擦除验证的半导体存储器件
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申请号: US749673申请日: 1996-11-15
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公开(公告)号: US5761122A公开(公告)日: 1998-06-02
- 发明人: Hiroshi Nakamura , Junichi Miyamoto , Yoshihisa Iwata , Keniti Imamiya
- 申请人: Hiroshi Nakamura , Junichi Miyamoto , Yoshihisa Iwata , Keniti Imamiya
- 申请人地址: JPX Kawasaki
- 专利权人: Kabushiki Kaisha Toshiba
- 当前专利权人: Kabushiki Kaisha Toshiba
- 当前专利权人地址: JPX Kawasaki
- 优先权: JPX6-044446 19940315; JPX6-218030 19940819
- 主分类号: G11C16/06
- IPC分类号: G11C16/06 ; G11C7/00 ; G11C16/02 ; G11C16/04 ; G11C16/10 ; G11C16/34 ; H01L21/8247 ; H01L27/115
摘要:
A semiconductor memory device includes a semiconductor substrate, a memory cell array having memory cells, each of which stores data, formed in matrix on the semiconductor substrate, a plurality of data latch circuits, each, of which is arranged at one end of at least one bit line connected to the memory cell array and for latching programming data, a control section for judging whether all of a plurality of latched data included in date latch groups constituted by the plurality of data latch circuits are the same as a first data or not and for controlling to change a potential of a plurality of first nodes according to the judging result, a section for detecting potentials of the plurality of the first nodes and for judging whether all data latched by the latch circuits are the same as the first data and for controlling to change a potential of a plurality of second nodes according to the judging result, and a section for detecting the potential of the plurality of second nodes and for outputting a judging result whether all of data latched by data latch circuits, are the same as the first data or not.
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