发明授权
US5763877A Analyzer using plasma and analysis method using plasma, interface used
for the same and sample introducing component used for the same
失效
使用等离子体分析仪和使用等离子体的分析方法,用于相同的界面和用于相同的样品引入组分
- 专利标题: Analyzer using plasma and analysis method using plasma, interface used for the same and sample introducing component used for the same
- 专利标题(中): 使用等离子体分析仪和使用等离子体的分析方法,用于相同的界面和用于相同的样品引入组分
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申请号: US715587申请日: 1996-09-18
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公开(公告)号: US5763877A公开(公告)日: 1998-06-09
- 发明人: Konosuke Oishi , Masamichi Tsukada , Toyoharu Okumoto , Takashi Iino
- 申请人: Konosuke Oishi , Masamichi Tsukada , Toyoharu Okumoto , Takashi Iino
- 申请人地址: JPX Tokyo
- 专利权人: Hitachi, Ltd.
- 当前专利权人: Hitachi, Ltd.
- 当前专利权人地址: JPX Tokyo
- 优先权: JPX7-252409 19950929
- 主分类号: G01N27/62
- IPC分类号: G01N27/62 ; G01N21/73 ; H01J49/04 ; H01J49/10
摘要:
In an analyzer in which plasma is generated, a sample is supplied to the plasma though an aerosol guide tube and analyzed by a quadrapole mass filter, the top end portion of the aerosol guide tube is made of sapphire.
公开/授权文献
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