发明授权
US5778551A Coordinate measuring apparatus having a device for profile measurements
and method for making said profile measurements
失效
具有用于轮廓测量的装置的坐标测量装置和用于进行所述轮廓测量的方法
- 专利标题: Coordinate measuring apparatus having a device for profile measurements and method for making said profile measurements
- 专利标题(中): 具有用于轮廓测量的装置的坐标测量装置和用于进行所述轮廓测量的方法
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申请号: US613846申请日: 1996-03-11
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公开(公告)号: US5778551A公开(公告)日: 1998-07-14
- 发明人: Henrik Herklotz , Thomas Arndt , Rainer Ohnheiser , Karl Schepperle
- 申请人: Henrik Herklotz , Thomas Arndt , Rainer Ohnheiser , Karl Schepperle
- 申请人地址: DEX Heidenheim
- 专利权人: Carl-Zeiss-Stiftung
- 当前专利权人: Carl-Zeiss-Stiftung
- 当前专利权人地址: DEX Heidenheim
- 优先权: DEX19508861.1 19950311
- 主分类号: G01B21/20
- IPC分类号: G01B21/20 ; G01B7/012 ; G01B7/34 ; G01B21/00 ; G01B21/04 ; G01B21/30 ; G01B7/28 ; G01B7/004
摘要:
For roughness measurements, a passive roughness probe 118 having a probe tip 119 is exchanged into the measuring probe head of the coordinate measuring apparatus in lieu of the probe pin having a probe ball which is otherwise used to make coordinate measurements. The generation of the measurement points takes place while using the already available measured value transducers 23 in the probe head of the coordinate measuring apparatus. The desired surface characteristic variables are computed from the stored quasi-analog measured point sequence with the aid of a corresponding software module.
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