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US5787043A Semiconductor memory device having a redundancy capability 失效
具有冗余能力的半导体存储器件

Semiconductor memory device having a redundancy capability
摘要:
A semiconductor device is provided which comprises a memory mat formed by dividing a memory into a plurality of blocks and a circuit arrangement disposed at every memory mat block for generating access suppression signals at least for defective memory cells within that block. Using this arrangement, the access speed to a redundant memory cell array for relieving the defects is increased so that a semiconductor memory device capable of a high speed operation is obtained.
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