Invention Grant
- Patent Title: Method and apparatus for detecting impurities on plate surface
- Patent Title (中): 用于检测板表面杂质的方法和装置
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Application No.: US619665Application Date: 1996-08-26
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Publication No.: US5808734APublication Date: 1998-09-15
- Inventor: Matti Kolari
- Applicant: Matti Kolari
- Assignee: Kolari; Matti
- Current Assignee: Kolari; Matti
- Priority: FIX941098 19940309
- Main IPC: B60S1/08
- IPC: B60S1/08 ; G01N21/43 ; G01N21/55 ; H02P1/04
Abstract:
The present invention relates to a method and apparatus for selective measurement of liquid and solid particles deposited on plate surfaces. The method is based on the transmission of radiation, which originates from total reflection from the interface between liquid droplets at the surface of the plate and surrounding gas, e.g., air. This radiation is transferred inside the plate as radiation undergoing total internal reflection between the surfaces of the plate. Such measuring radiation reaches a detector protected from background radiation, whereby intensity increase can be measured and used for the control, e.g., windshield wipers and washer equipment.
Public/Granted literature
- US5230063A Method and apparatus for selecting button function and retaining selected optics on a display Public/Granted day:1993-07-20
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