发明授权
- 专利标题: Automatic atomic force microscope with piezotube scanner
- 专利标题(中): 自动原子力显微镜带有压电扫描仪
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申请号: US748635申请日: 1996-11-13
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公开(公告)号: US5834644A公开(公告)日: 1998-11-10
- 发明人: Zhifeng Shao , Jian Xun Mou , Gang Huang
- 申请人: Zhifeng Shao , Jian Xun Mou , Gang Huang
- 申请人地址: VA Charlottesville
- 专利权人: The University of Virginia Patent Foundation
- 当前专利权人: The University of Virginia Patent Foundation
- 当前专利权人地址: VA Charlottesville
- 主分类号: G01Q60/00
- IPC分类号: G01Q60/00 ; G01B11/30 ; G01B21/30
摘要:
An atomic force microscope which can provide an automatic operation of focusing a laser beam onto a cantilever of the atomic force microscope, and which can ensure that a laser beam reflected off this cantilever is properly directed to a detector. A tip supported by the cantilever can also be automatically and properly lowered to a specimen. A piezotube scanner within such an atomic force microscope is also provided to prevent any damage from occurring if any leakage of an aqueous solution containing the specimen occurs.
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