发明授权
US5834644A Automatic atomic force microscope with piezotube scanner 失效
自动原子力显微镜带有压电扫描仪

Automatic atomic force microscope with piezotube scanner
摘要:
An atomic force microscope which can provide an automatic operation of focusing a laser beam onto a cantilever of the atomic force microscope, and which can ensure that a laser beam reflected off this cantilever is properly directed to a detector. A tip supported by the cantilever can also be automatically and properly lowered to a specimen. A piezotube scanner within such an atomic force microscope is also provided to prevent any damage from occurring if any leakage of an aqueous solution containing the specimen occurs.
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