公开(公告)号：US5834644A

公开(公告)日：1998-11-10

申请号：US748635

申请日：1996-11-13

申请人： Zhifeng Shao ,  Jian Xun Mou ,  Gang Huang

发明人： Zhifeng Shao ,  Jian Xun Mou ,  Gang Huang

IPC分类号： G01Q60/00 ,  G01B11/30 ,  G01B21/30

CPC分类号： G01Q20/02 ,  B82Y35/00 ,  G01Q10/04 ,  G01Q60/38 ,  Y10S977/87

摘要： An atomic force microscope which can provide an automatic operation of focusing a laser beam onto a cantilever of the atomic force microscope, and which can ensure that a laser beam reflected off this cantilever is properly directed to a detector. A tip supported by the cantilever can also be automatically and properly lowered to a specimen. A piezotube scanner within such an atomic force microscope is also provided to prevent any damage from occurring if any leakage of an aqueous solution containing the specimen occurs.

摘要翻译： 一种原子力显微镜，可以提供将激光束聚焦到原子力显微镜的悬臂上的自动操作，并且可以确保从该悬臂反射的激光束被适当地引导到检测器。 由悬臂支撑的尖端也可以自动适当地降低到试样。 还提供这种原子力显微镜内的压电扫描仪，以防止发生含有样品的水溶液泄漏时的任何损坏。