发明授权
US5894224A Method of testing a connection which includes a conductor in an integrated circuit 失效
测试包括集成电路中的导体的连接的方法

Method of testing a connection which includes a conductor in an
integrated circuit
摘要:
An integrated circuit includes a sensor which is arranged in the vicinity of a conductor in the circuit and is capable of measuring variations of the current through the conductor. This sensor, for example constructed as a coil, is capable of determining whether a connection which includes the conductor is in order. It can thus be tested notably whether the possibly multiple supply connection of the integrated circuit is appropriately connected to an external connection terminal.
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