发明授权
- 专利标题: Method of testing a connection which includes a conductor in an integrated circuit
- 专利标题(中): 测试包括集成电路中的导体的连接的方法
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申请号: US795156申请日: 1997-02-07
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公开(公告)号: US5894224A公开(公告)日: 1999-04-13
- 发明人: Franciscus G.M. De Jong
- 申请人: Franciscus G.M. De Jong
- 申请人地址: NY New York
- 专利权人: U.S. Philips Corporation
- 当前专利权人: U.S. Philips Corporation
- 当前专利权人地址: NY New York
- 优先权: EPX96201569 19960606
- 主分类号: G01R31/02
- IPC分类号: G01R31/02 ; G01R15/18 ; G01R15/20 ; G01R31/28 ; G01R31/303 ; G01R31/317 ; G01R31/3173
摘要:
An integrated circuit includes a sensor which is arranged in the vicinity of a conductor in the circuit and is capable of measuring variations of the current through the conductor. This sensor, for example constructed as a coil, is capable of determining whether a connection which includes the conductor is in order. It can thus be tested notably whether the possibly multiple supply connection of the integrated circuit is appropriately connected to an external connection terminal.
公开/授权文献
- US5267694A Fuel injection nozzle for internal combustion engines 公开/授权日:1993-12-07
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