发明授权
- 专利标题: Method of photoetching at 180 to 220
- 专利标题(中): 在180至220NM下光刻的方法
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申请号: US462546申请日: 1995-06-05
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公开(公告)号: US5928841A公开(公告)日: 1999-07-27
- 发明人: Toru Ushirogouchi , Makoto Nakase , Takuya Naito , Koji Asakawa
- 申请人: Toru Ushirogouchi , Makoto Nakase , Takuya Naito , Koji Asakawa
- 申请人地址: JPX Kawasaki
- 专利权人: Kabushiki Kaisha Toshiba
- 当前专利权人: Kabushiki Kaisha Toshiba
- 当前专利权人地址: JPX Kawasaki
- 优先权: JPX5-004953 19930114
- 主分类号: G03F7/004
- IPC分类号: G03F7/004 ; G03F7/039 ; G03F7/09 ; G03F7/20 ; G03C5/00
摘要:
Disclosed is a method of forming a pattern on a substrate, comprising a step of forming a light-sensitive layer containing an aromatic compound on a substrate, a step of patternwise exposing the light-sensitive layer with a light having a wavelength range shorter than the maximum wavelength; in the third absorption band from the long-wave side in the absorption spectrum of the aromatic compound and longer than the maximum wavelength in the fourth absorption band from the same, thereby to cause a photochemical reaction in the light-sensitive layer, and a step of developing the exposed light-sensitive layer, optionally after heat-treating the layer, so as to selectively remove the exposed area of the layer or leave the area as it is. The method gives a pattern having a high resolving power and an excellent dry-etching resistance.
公开/授权文献
- US3948987A Substituted methanesulfonanilides 公开/授权日:1976-04-06