Invention Grant
- Patent Title: Process for detecting totally or partially hidden non-homogeneities by means of microwave radiation
- Patent Title (中): 通过微波辐射检测全部或部分隐藏的非均匀性的过程
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Application No.: US653198Application Date: 1996-05-24
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Publication No.: US5933014APublication Date: 1999-08-03
- Inventor: Matthias Hartrumpf , Roland Munser
- Applicant: Matthias Hartrumpf , Roland Munser
- Applicant Address: DEX Munich
- Assignee: Fraunhofer Gesellschaft zur Foerderung
- Current Assignee: Fraunhofer Gesellschaft zur Foerderung
- Current Assignee Address: DEX Munich
- Main IPC: G01N22/02
- IPC: G01N22/02
Abstract:
A process for detecting totally or partially hidden faults, such as cracks, and bubbles and the like in an opaque medium, by using microwave radiation. Microwaves from a transmitting antenna are directed against the surface of the medium which is to be inspected, and microwave radiation reflected or back scattered from the medium is detected and analyzed. In order to maximize the signal to noise ratio, minimizing the detection of radiation reflected by the surfaces of the medium itself, at least one of the transmitting antenna and the receiving antenna is oriented at an oblique angle relative to the surface of the medium.
Public/Granted literature
- US5136275A Ground connection monitoring for airbag electrical igniter circuit Public/Granted day:1992-08-04
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