公开(公告)号：US06858836B1

公开(公告)日：2005-02-22

申请号：US09622278

申请日：1999-02-11

Applicant: Matthias Hartrumpf

Inventor： Matthias Hartrumpf

IPC: G01B11/10 ,  G01B11/02 ,  G01B11/08 ,  H01J3/14 ,  H01J5/16 ,  H01J40/14

CPC classification number: G01B11/08

Abstract: The invention relates to a laser scanner measurement system, comprising a transmission unit consisting of a laser, beam deflection unit and transmitting optical system, and a receiving part with a photodetector which is arranged in the focal plane of the optical system destined for the receiving beam path. The invention is characterized in that the scanner unit and receiving unit are arranged on the same side in relation to the object and the surface normal of the receiving optical system is parallel to the direction of radiation of the scanner unit, i.e. that the scanner and receiver beam path in the outer area at all times have the same optical axis or that the axes are displaced parallel to each other and perpendicular to the direction ofmovement of the laser beam.

Abstract translation: 本发明涉及一种激光扫描仪测量系统，其包括由激光，光束偏转单元和透射光学系统组成的传输单元，以及具有光电检测器的接收部件，该光电检测器设置在用于接收光束的光学系统的焦平面中 路径。 本发明的特征在于，扫描仪单元和接收单元相对于物体设置在同一侧，并且接收光学系统的表面法线平行于扫描仪单元的辐射方向，即扫描仪和接收器 外部区域中的光束路径始终具有相同的光轴，或者轴彼此平行移动并且垂直于激光束的移动方向。

公开(公告)号：US5933014A

公开(公告)日：1999-08-03

申请号：US653198

申请日：1996-05-24

Applicant: Matthias Hartrumpf ,  Roland Munser

Inventor： Matthias Hartrumpf ,  Roland Munser

IPC: G01N22/02

CPC classification number: G01N22/02

Abstract: A process for detecting totally or partially hidden faults, such as cracks, and bubbles and the like in an opaque medium, by using microwave radiation. Microwaves from a transmitting antenna are directed against the surface of the medium which is to be inspected, and microwave radiation reflected or back scattered from the medium is detected and analyzed. In order to maximize the signal to noise ratio, minimizing the detection of radiation reflected by the surfaces of the medium itself, at least one of the transmitting antenna and the receiving antenna is oriented at an oblique angle relative to the surface of the medium.

Abstract translation: 通过使用微波辐射来检测不透明介质中的全部或部分隐藏的缺陷，如裂纹和气泡等的过程。 来自发射天线的微波被引导到待检查的介质的表面，并且检测和分析从介质反射或反向散射的微波辐射。 为了最大化信噪比，最小化由介质本身的表面反射的辐射的检测，发射天线和接收天线中的至少一个相对于介质的表面以倾斜的角度定向。

公开(公告)号：US09222879B2

公开(公告)日：2015-12-29

申请号：US13818188

申请日：2011-09-09

Applicant: Matthias Hartrumpf

Inventor： Matthias Hartrumpf

IPC: G01N21/21 ,  G01N15/14

CPC classification number: G01N21/21 ,  G01N15/1434 ,  G01N15/1463 ,  G01N15/1475 ,  G01N21/84 ,  G01N2015/144 ,  G01N2021/845 ,  G01N2201/0438 ,  G01N2201/06113

Abstract: The present invention relates to a device for optical characterization of a sample and/or of the material(s) of the same having an illumination unit that can be orientated to illuminate with incident light a sample spatial portion into which the sample can be introduced, a detection unit which is orientated or can be orientated to image the sample introduced into the sample spatial portion by receiving light reflected by the sample, and which is configured to detect at least two different, preferably orthogonal, polarization components in the reflected light, and an evaluation unit with which, in the imaging data recorded by the detection unit, those imaged surface elements (reflection elements) of the sample can be identified, and with which the detected different polarization components for these reflection elements can be evaluated for optical characterization.

Abstract translation: 本发明涉及一种用于光学表征样品和/或其材料的装置，该装置具有照明单元，该照明单元可以被定向为用入射光照射样品可以引入其中的样品空间部分， 一个检测单元，其被定向或可以被定向以通过接收由样本反射的光来对引入到样本空间部分中的样品成像，并且被配置为检测反射光中的至少两个不同的，优选正交的偏振分量;以及 评估单元，在由检测单元记录的成像数据中，可以识别样品的那些成像表面元件（反射元件），并且可以通过该评估单元评估用于这些反射元件的检测到的不同偏振分量用于光学表征。

公开(公告)号：US20100080456A1

公开(公告)日：2010-04-01

申请号：US12447040

申请日：2007-10-10

Applicant: Detlef Paul ,  Matthias Burkhard ,  Michal Palmer ,  Matthias Hartrumpf

Inventor： Detlef Paul ,  Matthias Burkhard ,  Michal Palmer ,  Matthias Hartrumpf

IPC: G06K9/00

CPC classification number: B07C5/366 ,  B07C5/3422 ,  B07C5/3425 ,  G01N21/255

Abstract: A device and a method are described for the optical selection of components of at least one fraction from a bulk material stream conveyed along a conveyance direction, having a camera unit, whose camera viewing direction is oriented toward the bulk material stream, a background, situated in the camera viewing direction behind the bulk material stream, whose color is adaptable to the color of a selected fraction of components of the bulk material stream, an analysis and control unit, connected to the camera unit, in which control commands for a separation unit, which is capable of separating the components to be selected out of the bulk material stream upon activation, may be generated according to a decision criterion.

Abstract translation: 描述了一种装置和方法，用于从沿着传送方向传送的散装物料流中至少一个部分的部件的光学选择，其具有照相机单元，其相机观察方向朝向散装物料流，位于 在大量材料流背后的相机观察方向上，其颜色适应于散装材料流的所选部分的颜色;连接到相机单元的分析和控制单元，其中分离单元的控制命令 能够根据决定标准来生成能够在激活时从批量材料流中选出的组分分离。

公开(公告)号：US06853200B2

公开(公告)日：2005-02-08

申请号：US10239580

申请日：2001-03-16

Applicant: Roland Munser ,  Helge-Björn Kuntze ,  Matthias Hartrumpf

Inventor： Roland Munser ,  Helge-Björn Kuntze ,  Matthias Hartrumpf

IPC: E03F7/12 ,  F16L55/48 ,  G01R27/32

CPC classification number: F16L55/48 ,  E03F7/12

Abstract: A method for retrieving predetermined locations in sewer and pipeline systems after application or deposition of a layer of material. A carrier vehicle having a microwave sensor emits microwave signals and receives backscattered microwave signals. A first run is conducted inside the sewer or pipeline system before application or deposition of the layer of material. A first temporal signal profile of the backscattered microwave signals is recorded and the sought locations are marked in the first signal profile. After the application or deposition of the layer of material, a second run is conducted. A second temporal signal profile of the backscattered signals is recorded. The current position of the vehicle in the sewer or pipeline system relative to the sought locations is determined by comparison with the first signal profile.

Abstract translation: 一种用于在施加或沉积材料层之后检索下水道和管道系统中的预定位置的方法。 具有微波传感器的载体车辆发射微波信号并接收反向散射的微波信号。 在施用或沉积材料层之前，首先在污水管道或管道系统内进行。 记录背向散射的微波信号的第一时间信号分布，并且在第一信号分布中标记所寻找的位置。 在施加或沉积材料层之后，进行第二次运行。 记录反向散射信号的第二时间信号分布。 通过与第一信号轮廓比较来确定车辆在下水道或管道系统中相对于寻找位置的当前位置。

公开(公告)号：US08285029B2

公开(公告)日：2012-10-09

申请号：US12447040

申请日：2007-10-10

Applicant: Detlef Paul ,  Matthias Burkhard ,  Michal Palmer ,  Matthias Hartrumpf

Inventor： Detlef Paul ,  Matthias Burkhard ,  Michal Palmer ,  Matthias Hartrumpf

IPC: G06K9/00

CPC classification number: B07C5/366 ,  B07C5/3422 ,  B07C5/3425 ,  G01N21/255

Abstract: A device and a method are described for the optical selection of components of at least one fraction from a bulk material stream conveyed along a conveyance direction, having a camera unit, whose camera viewing direction is oriented toward the bulk material stream, a background, situated in the camera viewing direction behind the bulk material stream, whose color is adaptable to the color of a selected fraction of components of the bulk material stream, an analysis and control unit, connected to the camera unit, in which control commands for a separation unit, which is capable of separating the components to be selected out of the bulk material stream upon activation, may be generated according to a decision criterion.

Abstract translation: 描述了一种装置和方法，用于从沿着传送方向传送的散装物料流中至少一个部分的部件的光学选择，其具有照相机单元，其相机观察方向朝向散装物料流，位于 在大量材料流背后的相机观察方向上，其颜色适应于散装材料流的所选部分的颜色;连接到相机单元的分析和控制单元，其中分离单元的控制命令 能够根据决定标准来生成能够在激活时从批量材料流中选出的组分分离。

公开(公告)号：US5315371A

公开(公告)日：1994-05-24

申请号：US970469

申请日：1992-11-02

Applicant: Matthias Hartrumpf

Inventor： Matthias Hartrumpf

IPC: D01D5/088 ,  D01D11/00 ,  G01B11/00 ,  G01B11/02 ,  G01B9/02

CPC classification number: G01B11/024

Abstract: A device for measuring the position of a filament bundle as it is withdrawnertically from a spinnerette, and blown against for cooling, comprising a source of light disposed adjacent the filament bundle in a plane approximately normal to the withdrawing direction, light detector means disposed at an angle .alpha. relative to the source of light, wherein the angle is sufficiently wide that light from the source of light will not impinge directly on the detector means, and analyzer means to calculate the position of the filament bundle on the basis of the signal issuing from the detector means.

Abstract translation: 一种用于测量丝束从喷丝头垂直取出并被吹扫以冷却的位置的​​装置，包括在大致垂直于抽出方向的平面中邻近丝束排列的光源，光检测器装置设置在 相对于光源的角度α，其中角度足够宽，使得来自光源的光不会直接照射在检测器装置上，以及分析器装置，用于基于信号发出来计算细丝束的位置 从检测器装置。

公开(公告)号：US20130222803A1

公开(公告)日：2013-08-29

申请号：US13818188

申请日：2011-09-09

Applicant: Matthias Hartrumpf

Inventor： Matthias Hartrumpf

IPC: G01N21/21

CPC classification number: G01N21/21 ,  G01N15/1434 ,  G01N15/1463 ,  G01N15/1475 ,  G01N21/84 ,  G01N2015/144 ,  G01N2021/845 ,  G01N2201/0438 ,  G01N2201/06113

Abstract: The present invention relates to a device for optical characterisation of a sample and/or of the material/materials of the same having an illumination unit which is orientated or can be orientated to illuminate with incident light a sample spatial portion into which the sample can be introduced, a detection unit which is orientated or can be orientated to image the sample introduced into the sample spatial portion by receiving light reflected by the sample, and which is configured to detect at least two different, preferably two orthogonal, polarisation components in the reflected light, and an evaluation unit with which, in the imaging data recorded by the detection unit, those imaged surface elements (reflection elements) of the sample can be identified, the reflected, received light of which is based on a reflection of the incident light on the sample, and with which the detected different polarisation components for these reflection elements can be evaluated for optical characterisation.

Abstract translation: 本发明涉及一种用于光学表征样品和/或其材料/材料的装置，该装置具有照明单元，照明单元被定向或可被定向以用入射光照射样品空间部分 引入了一种检测单元，其被定向或可以被定向以通过接收由样本反射的光来对引入到样本空间部分的样品成像，并且被配置为检测反射的至少两个不同的，优选两个正交的偏振分量 光和评估单元，其中在由检测单元记录的成像数据中，能够识别样品的那些成像表面元件（反射元件），其反射的接收光基于入射光的反射 对于这些反射元件，检测出的不同的偏振分量可以被评估为光学特性 ation。

公开(公告)号：US20100230327A1

公开(公告)日：2010-09-16

申请号：US12681921

申请日：2008-10-09

Applicant: Matthias Hartrumpf ,  Rudiger Heintz

Inventor： Matthias Hartrumpf ,  Rudiger Heintz

IPC: B07C5/342

CPC classification number: B07C5/3425 ,  G01N15/147 ,  G01N15/1475

Abstract: A device is disclosed for the classification of a transparent component of a material flow using an optical detector unit, with allocatable optical axis which is directed toward the material flow, at least one illumination unit for illuminating the material flow from a space over the material flow, in which the optical detector unit is also contained, and a classifier, which classifies the component based on information which is recorded from the component using the optical detector unit, and a decision criterion. A retroreflector is provided at least longitudinally relative to the optical axis of the detector unit, downstream from the material flow in the viewing direction of the detector, the illumination unit provides at least two light sources, with first light source emitting light of a first type and a second light source emitting light of a second type, The light of at least the first light source is incident on the material flow longitudinally relative to the optical axis. The optical detector unit detects light from both light sources selectively. The light of the second light source illuminates the material flow from an uplighting source providing the light incident on the material flow which is flatly distributed and not longitudinally relative to the optical axis of the detector unit, or the light of the second light source is incident on the material flow longitudinally relative to the optical axis.

Abstract translation: 公开了一种用于使用光学检测器单元对材料流的透明部件进行分类的装置，其具有指向材料流的可分配的光轴，用于从材料流上的空间照射材料流的至少一个照明单元 ，还包含光检测器单元的分类器，以及基于使用光检测器单元从分量记录的信息对分量进行分类的分类器和判定标准。 后向反射器相对于检测器单元的光轴至少纵向地设置在检测器的观察方向上的材料流的下游，照明单元提供至少两个光源，第一光源发射第一类型的光 以及发射第二类型的光的第二光源。至少第一光源的光相对于光轴纵向入射在材料流上。 光检测器单元有选择地检测来自两个光源的光。 第二光源的光照亮来自上光源的材料流，其提供入射到材料流的光，该光流平坦地分布且相对于检测器单元的光轴不是纵向的，或者第二光源的光入射 材料流动相对于光轴纵向。

公开(公告)号：US6097491A

公开(公告)日：2000-08-01

申请号：US155980

申请日：1999-02-09

Applicant: Matthias Hartrumpf

Inventor： Matthias Hartrumpf

IPC: G01B11/03 ,  G01S17/42 ,  G01S17/74 ,  G01S17/87 ,  G01B11/14 ,  G01V8/00

CPC classification number: G01S17/42 ,  G01S17/74 ,  G01S17/875 ,  G01S2007/4975 ,  G01S2007/4977 ,  G01S7/497

Abstract: A device is disclosed for measuring the co-ordinates of at least one retrflector applied on an object. The light emitted by a lighting unit reaches the at least one retroreflector through a beam splitter, the light reflected from the retroreflector towards the beam splitter is separated from the path of the lighting beam, and said light falls on a detector unit by means of which the position of incidence of the detected light spot can be determined. The light from the lighting unit forms a beam which lights on the surface of the object a larger surface area than the surface area of the at least one retroreflector applied thereon. The detector unit is located in a place where the position and/or shape of the detected light spot change with the position of the retroreflector.

Abstract translation: PCT No.PCT / EP97 / 01783 Sec。 371日期1999年2月9日 102（e）1999年2月9日PCT 1997年4月10日PCT PCT。 公开号WO97 / 38327 日期1997年10月16日公开了一种用于测量施加在物体上的至少一个后向反射器的坐标的装置。 由照明单元发射的光通过分束器到达至少一个后向反射器，从后向反射器反射到分束器的光与照明光束的路径分离，并且所述光落在检测器单元上，由此 可以确定检测到的光斑的入射位置。 来自照明单元的光形成在物体表面上点亮的光束比施加于其上的至少一个后向反射器的表面积更大的表面积。 检测器单元位于检测到的光斑的位置和/或形状随着后向反射器的位置而变化的位置。