发明授权
- 专利标题: Method and apparatus for testing dies
- 专利标题(中): 测试模具的方法和装置
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申请号: US852470申请日: 1997-05-07
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公开(公告)号: US5942907A公开(公告)日: 1999-08-24
- 发明人: Cheng-Lien Chiang
- 申请人: Cheng-Lien Chiang
- 申请人地址: TWX Hsinchu
- 专利权人: Industrial Technology Research Institute
- 当前专利权人: Industrial Technology Research Institute
- 当前专利权人地址: TWX Hsinchu
- 主分类号: G01R31/26
- IPC分类号: G01R31/26 ; G01R31/28 ; H01L21/66 ; G01R31/02
摘要:
In accordance with the present invention, a test board for connecting a bare die to a leadframe for testing the die is provided. The test board has a conducting surface on a bottom portion of the board that is adapted to engage and electrically connect to a lead finger in the leadframe. A tape automated bonding tape which has a conductive lead and a first and a second conductive bump are provided where the first conductive bump is situated on an upper surface of the lead and the second conductive bump is situated on a bottom surface of the lead. The first and second conductive bumps establish an electrical communication between the bumps throughout the conductive lead. The first conductive bump is also connected to the conducting surface of the board and the second bump is adapted to engage in I/O pad so that the bare die may be tested through the leadframe.
公开/授权文献
- US4751070A Low temperature synthesis 公开/授权日:1988-06-14
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