发明授权
US5976966A Converting a hydrogen silsesquioxane film to an oxide using a first heat treatment and a second heat treatment with the second heat treatment using rapid thermal processing 失效
使用第一热处理和第二热处理将氢倍半硅氧烷膜转化为氧化物,使用快速热处理

  • 专利标题: Converting a hydrogen silsesquioxane film to an oxide using a first heat treatment and a second heat treatment with the second heat treatment using rapid thermal processing
  • 专利标题(中): 使用第一热处理和第二热处理将氢倍半硅氧烷膜转化为氧化物,使用快速热处理
  • 申请号: US964580
    申请日: 1997-11-05
  • 公开(公告)号: US5976966A
    公开(公告)日: 1999-11-02
  • 发明人: Yushi Inoue
  • 申请人: Yushi Inoue
  • 申请人地址: JPX
  • 专利权人: Yamaha Corporation
  • 当前专利权人: Yamaha Corporation
  • 当前专利权人地址: JPX
  • 优先权: JPX8-308786 19961105
  • 主分类号: H01L21/312
  • IPC分类号: H01L21/312 H01L21/314 H01L21/316 H01L21/768 H01L23/522 H01L21/4763
Converting a hydrogen silsesquioxane film to an oxide using a first heat
treatment and a second heat treatment with the second heat treatment
using rapid thermal processing
摘要:
An insulating film is formed by CVD on the surface of a semiconductor substrate formed with circuit elements such as transistors, and thereafter a hydrogen silsesquioxane resin film is formed on the insulating film by spin-coating or the like. This resin film is sequentially subjected to low temperature annealing at 400.degree. C. or lower and then to high temperature annealing at 700.degree. C. or higher. The low temperature annealing changes the resin film into a silicon oxide film, and the high temperature annealing is performed in order to make dense the film quality of the silicon oxide film. The high temperature annealing is performed by rapid thermal annealing in an oxidizing atmosphere of water vapor or the like. A CVD insulating film is formed on the densified silicon oxide film and planarized by CMP or the like, according to necessity. A contact hole is formed through the CVD insulating film, densified silicon oxide film and the insulating film, and a wiring layer is thereafter deposited.
公开/授权文献
信息查询
IPC分类:
H 电学
H01 基本电气元件
H01L 半导体器件;其他类目中不包括的电固体器件(使用半导体器件的测量入G01;一般电阻器入H01C;磁体、电感器、变压器入H01F;一般电容器入H01G;电解型器件入H01G9/00;电池组、蓄电池入H01M;波导管、谐振器或波导型线路入H01P;线路连接器、汇流器入H01R;受激发射器件入H01S;机电谐振器入H03H;扬声器、送话器、留声机拾音器或类似的声机电传感器入H04R;一般电光源入H05B;印刷电路、混合电路、电设备的外壳或结构零部件、电气元件的组件的制造入H05K;在具有特殊应用的电路中使用的半导体器件见应用相关的小类)
H01L21/00 专门适用于制造或处理半导体或固体器件或其部件的方法或设备
H01L21/02 .半导体器件或其部件的制造或处理
H01L21/04 ..至少具有一个跃变势垒或表面势垒的器件,例如PN结、耗尽层、载体集结层
H01L21/18 ...器件有由周期表Ⅳ族元素或含有/不含有杂质的AⅢBⅤ族化合物构成的半导体,如掺杂材料
H01L21/30 ....用H01L21/20至H01L21/26各组不包含的方法或设备处理半导体材料的(在半导体材料上制作电极的入H01L21/28)
H01L21/31 .....在半导体材料上形成绝缘层的,例如用于掩膜的或应用光刻技术的(密封层入H01L21/56);以及这些层的后处理;这些层的材料的选择
H01L21/312 ......有机层,例如光刻胶(H01L21/3105、H01L21/32优先)
0/0