Invention Grant
US5978082A Atomic absorptiometer and a metal specimen atomic vapor generation
apparatus used in the atomic absorotiometer
失效
原子吸收光谱仪和原子吸收测定仪中使用的金属试样原子蒸汽发生装置
- Patent Title: Atomic absorptiometer and a metal specimen atomic vapor generation apparatus used in the atomic absorotiometer
- Patent Title (中): 原子吸收光谱仪和原子吸收测定仪中使用的金属试样原子蒸汽发生装置
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Application No.: US14069Application Date: 1998-01-27
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Publication No.: US5978082APublication Date: 1999-11-02
- Inventor: Yasushi Terui , Kazuo Moriya , Hiromi Yamashita , Hayato Tobe
- Applicant: Yasushi Terui , Kazuo Moriya , Hiromi Yamashita , Hayato Tobe
- Applicant Address: JPX Tokyo
- Assignee: Hitachi, Ltd.
- Current Assignee: Hitachi, Ltd.
- Current Assignee Address: JPX Tokyo
- Priority: JPX9-022827 19970205
- Main IPC: G01N21/31
- IPC: G01N21/31 ; G01J3/42 ; G01N21/74
Abstract:
The object of this invention is to provide an atomic absorptiometer and a metal specimen atomic vapor generation apparatus used in the atomic absorptiometer, which enable a light absorption measurement based on the Zeeman effect highly capable of background correction and eliminate the need for the troublesome work of dismounting a magnet. For this purpose, the following configuration is employed. First, the specimen, hydrochloric acid, and sodium borohydride are delivered and mixed by the peristaltic pump 10 to produce a metallic hydride. The generated gas-liquid mixture solution is separated by the separator 12 into a specimen gas and liquids. The separated specimen gas is introduced into the heating section 30. Electricity is supplied from the power source 28 to the specimen heating section 30 where the specimen gas introduced is heated and separated into hydrogen and a specimen metal vapor to be measured. The specimen metal vapor is then introduced into the measuring section 34 arranged between magnetic poles of the magnet 32 where the metal vapor is subjected to the atomic absorptiometric analysis based on the Zeeman effect.
Public/Granted literature
- USD372352S Food product Public/Granted day:1996-08-06
Information query
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