摘要:
The object of this invention is to provide an atomic absorptiometer and a metal specimen atomic vapor generation apparatus used in the atomic absorptiometer, which enable a light absorption measurement based on the Zeeman effect highly capable of background correction and eliminate the need for the troublesome work of dismounting a magnet. For this purpose, the following configuration is employed. First, the specimen, hydrochloric acid, and sodium borohydride are delivered and mixed by the peristaltic pump 10 to produce a metallic hydride. The generated gas-liquid mixture solution is separated by the separator 12 into a specimen gas and liquids. The separated specimen gas is introduced into the heating section 30. Electricity is supplied from the power source 28 to the specimen heating section 30 where the specimen gas introduced is heated and separated into hydrogen and a specimen metal vapor to be measured. The specimen metal vapor is then introduced into the measuring section 34 arranged between magnetic poles of the magnet 32 where the metal vapor is subjected to the atomic absorptiometric analysis based on the Zeeman effect.
摘要:
An atomic absorption spectrophotometer possessing an electrical heating unit which includes a graphite tube for atomizing a sample by heating the sample; a light emitting unit for emitting measuring light and irradiating the atomized sample with the measuring light; a spectroscope unit for diffracting the measuring light passing the electrical heating unit and selecting the required wavelength component; a detection unit for detecting the quantity of the required wavelength component selected by the spectroscope unit; an input unit to input at least one of the wavelengths of the required wavelength component and the required heating temperature of the electrical heating unit; and a control unit for controlling the above units, which comprises a shading device provided at the propagation axis of the measuring light between the electrical heating unit and the detection unit, and which possesses a light transmitting unit, for restricting the quantity of the measuring light passing the electrical heating unit, with the area of the light transmitting unit being changeable; and wherein the area of the light transmitting unit in the shading device is changed according to the set measurement conditions.
摘要:
In an analysis device, an auxiliary gas supplied from a compressor 1 is introduced from an auxiliary gas inlet 3 via a pipe 2 to a burner through a pressure regulator 5, a pressur meter 6, a pressure switch 7 and a connecting joint 8. On the other hand, a combustible gas supplied from a gas bomb 9 is introduced from a combustible gas inlet 11 via a pipe 10 to the burner through a first electromagnetic valve 12, a pressure regulator 13, a pressure meter 14, a needle valve 15, a second electromagnetic valve 16 and a connecting joint 17 and further via a tube. An auxiliary gas use block 4, on which auxiliary gas flow controlling elements such as the pressure regulator 5, the pressure meter 6 and the pressure switch 7 are secured, is provided independent and separated from a combustible gas use block 18, on which combustible gas flow controlling elements such as the first electromagnetic valve 12, the pressure regulator 13, the pressure meter 14, the needle valve 15 and the second electromagnetic valve 16 are secured. Whereby the analysis device using chemical combustion flame having an element safety is provided in which possible danger caused by such as the gas leakage and the gas mixing between the combustible gas passage and the auxiliary gas passage is further reduced.
摘要:
A light beam emitted by a hollow cathode lamp is concentrated on a central portion of an electrothermal sample atomizing apparatus by a concave mirror. The light concentrated on the central portion of the electrothermal sample atomizing apparatus is further concentrated on a central portion of a flame produced in a burner type sample atomizing apparatus by a lens. The light traveled through the burner type sample atomizing apparatus is condensed by a concave mirror, reflected by a flat mirror, and concentrated on an entrance slit of a spectroscope. Light outgoing through an exit slit of the spectroscope is detected by a photodetector.
摘要:
The invention intends to provide an atomic absorption spectrophotometer which can establish a uniform heat distribution during heating of a sample and can improve analysis accuracy and analyzing efficiency. For this purpose, a graphite tube type cuvette mounted in a graphite atomizer furnace for an atomic absorption spectrophotometer comprises a large-diameter portion for retaining a sample in place, a small-diameter portion connected to the large-diameter portion and having a smaller diameter than the large-diameter portion, and a step portion for demarcating between the large-diameter portion and the small-diameter portion. The graphite tube type cuvette is formed such that its cross-sectional area in a plane perpendicular to the direction of passage of an electric current supplied to the cuvette is the same in any of the large-diameter portion, the small-diameter portion and the step portion. The amount of resistance heat is thereby also the same in any portions.
摘要:
A defective particle measuring apparatus that irradiates focused laser light on a sample, images scattered light from the sample, and measures defective particles in the sample based on the image result, includes a position deviation computing portion which, based on an in-plane intensity distribution of scattered light of each defective particle that is imaged, obtains a deviation from a focal point position on an image point side of the scattered light of each defective particle and calculates a position deviation amount in a depth direction of the defective particle corresponding to the deviation from the focal point position, a light intensity correcting portion for correcting the light intensity of the scattered light of the defective particle corresponding to the position deviation amount in the depth direction, and a size determining portion for determining the defective particle size based on the light intensity corrected by the light intensity correcting portion. Thus, the size of the defective particles can be determined at a high precision by a simple constitution in a short time, and density distribution of the defective particles can be obtained.
摘要:
A defect evaluation apparatus of this invention includes a laser irradiation unit for obliquely irradiating a laser beam onto an object, and an observation unit for observing scattered light from inside the object or a surface of the object. The laser irradiation unit irradiates the laser beam onto the object from a plurality of incident directions around an observation optical axis, and the observation unit receives the scattered light from the object to obtain shape information of a defect in the object or on the surface of the object.
摘要:
A defect estimating apparatus includes a laser radiating unit For obliquely radiating laser light on a surface to be observed of an object to be inspected, an observing unit for observing, through the surface to be observed, scattered light produced From internal defects or particles of the object by refracted light of the laser light, and observing scattered light or reflected light produced from flaws or particles on the surface by tile laser light, and a component separating unit for allowing the observing unit to perform observation by using both light containing primarily a p-polarized light component of the laser light and light containing primarily an s-polarized light component of the laser light.
摘要:
A grinding machine provided with an apparatus for changing a feed rate of a grinding wheel relative to a workpiece just before the grinding wheel comes into contact with the workpiece. An electrode device is mounted adjacent to the grinding wheel and connected to an electric power source for applying a potential to the surface of the grinding wheel. A detecting device detects a difference of potential between the grinding wheel and the workpiece to generate an output voltage. A memory device memorizes the output voltage detected when the grinding wheel is distant from the workpiece. A setting device reduces the memorized output voltage at a predetermined rate to provide a reference voltage corresponding to a predetermined gap between the grinding wheel and the workpiece. A comparator circuit compares the output voltage with the reference voltage to generate a feed rate changing signal when the output voltage attains the reference voltage. A control device controls a feed device so as to change the feed rate of a wheel slide in accordance with the feed rate changing signal.
摘要:
A size of particle or defect in an object is measured. A laser beam is guided through an optical system into the object. A light receiving element receives scattered light from a particle or a defect in the object. A scattering image is formed by an image processor from the scattered light thus received. The size of particle or defect is obtained by integrating a scattering intensity of the scattered light. Also, a size distribution of particle or defect in an object may be acquired by detecting a maximum scattering intensity of each particle or defect. A polarization dependency of scattering may be checked as well.