发明授权
US5986459A Semiconductor device testing carrier and method of fixing semiconductor
device to testing carrier
失效
半导体器件测试载体和固定半导体器件到测试载体的方法
- 专利标题： Semiconductor device testing carrier and method of fixing semiconductor device to testing carrier
- 专利标题（中）： 半导体器件测试载体和固定半导体器件到测试载体的方法
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申请号： US889217申请日： 1997-07-08
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公开(公告)号： US5986459A公开(公告)日： 1999-11-16
- 发明人: Futoshi Fukaya , Shigeyuki Maruyama
- 申请人： Futoshi Fukaya , Shigeyuki Maruyama
- 申请人地址： JPX Kanagawa
- 专利权人： Fujitsu Limited
- 当前专利权人： Fujitsu Limited
- 当前专利权人地址： JPX Kanagawa
- 优先权： JPX8-161449 19960621; JPX9-066990 19970319
- 主分类号： G01R1/04
- IPC分类号： G01R1/04 ; G01R31/28 ; G01R31/26
摘要：
A testing carrier has a flexible material such as a thin film employed as a supporting body which covers and thrusts a semiconductor device against a substrate. The substrate includes a plurality of contact terminals and a plurality of testing wiring patterns.
公开/授权文献
- US5226730A Internal temperature monitor for work pieces 公开/授权日：1993-07-13
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