A method an apparatus for performing a reset operation in an integrated circuit where a memory programming voltage is recovered allowing use of the memory during reset. The voltage recovery unit includes a high voltage conversion portion active for a first recovery period, and a low voltage conversion portion active for a subsequent second recovery period, the low voltage conversion portion is inactive for the first recovery period. The first and second recovery portions are responsive to assertion of a reset signal and an intermediate reset signal generated before the end of the reset period. Recovery of the programming voltage allows uncorrupted retrieval and use of a configuration word during reset. The high voltage conversion portion includes p-channel devices with robust breakdown resistance, and the low voltage conversion portion includes n-channel devices which provides improved speed of operation.