Invention Grant
- Patent Title: Method of and an apparatus for photothermally examining workpiece surfaces
- Patent Title (中): 光热检测工件表面的方法和设备
-
Application No.: US865384Application Date: 1997-05-29
-
Publication No.: US6019504APublication Date: 2000-02-01
- Inventor: Horst Adams
- Applicant: Horst Adams
- Applicant Address: CHX Altstatten
- Assignee: Wagner International AG
- Current Assignee: Wagner International AG
- Current Assignee Address: CHX Altstatten
- Priority: DEX19623121 19960610
- Main IPC: G01B11/06
- IPC: G01B11/06 ; G01N21/17 ; G01N25/72
Abstract:
A method of photothermally examining workpiece surfaces, wherein an electromagnetic exciting beam is directed from a measuring unit to a point to be measured on the workpiece surface so as to heat the workpiece surface at that point and, furthermore, the heat radiation emitted from the point to be measured is detected and analyzed, is characterized in that a plurality of selected points to be measured on the workpiece surface are irradiated by at least a partial beam of the exciting beam, and the heat rays issuing from the points to be measured are sensed and subjected to joint analysis.
Public/Granted literature
- US5181874A Method of making microelectronic field emission device with air bridge anode Public/Granted day:1993-01-26
Information query