Invention Grant
US6019504A Method of and an apparatus for photothermally examining workpiece surfaces 失效
光热检测工件表面的方法和设备

Method of and an apparatus for photothermally examining workpiece
surfaces
Abstract:
A method of photothermally examining workpiece surfaces, wherein an electromagnetic exciting beam is directed from a measuring unit to a point to be measured on the workpiece surface so as to heat the workpiece surface at that point and, furthermore, the heat radiation emitted from the point to be measured is detected and analyzed, is characterized in that a plurality of selected points to be measured on the workpiece surface are irradiated by at least a partial beam of the exciting beam, and the heat rays issuing from the points to be measured are sensed and subjected to joint analysis.
Information query
Patent Agency Ranking
0/0