发明授权
- 专利标题： Semiconductor device and method of manufacturing the same with stable control of lifetime carriers
- 专利标题（中）： 半导体器件及其制造方法与寿命载体的稳定控制
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申请号： US950841申请日： 1997-10-15
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公开(公告)号： US6031276A公开(公告)日： 2000-02-29
- 发明人: Akihiko Osawa , Yoshiro Baba , Masanobu Tsuchitani , Shizue Hori
- 申请人： Akihiko Osawa , Yoshiro Baba , Masanobu Tsuchitani , Shizue Hori
- 申请人地址： JPX Kawasaki
- 专利权人： Kabushiki Kaisha Toshiba
- 当前专利权人： Kabushiki Kaisha Toshiba
- 当前专利权人地址： JPX Kawasaki
- 优先权： JPX8-274780 19961017; JPX9-200064 19970725
- 主分类号： H01L29/74
- IPC分类号： H01L29/74 ; H01L21/265 ; H01L21/266 ; H01L21/322 ; H01L21/329 ; H01L29/32 ; H01L29/861 ; H01L26/30
摘要：
A semiconductor device includes a plurality of defect layers separated from one another in the semiconductor layer. A distance separating any adjacent ones of the defect layers is kept such that they are prevented from contacting each other and those regions having effect of shortening a carrier lifetime overlap each other.
公开/授权文献
- US5421004A Hierarchical testing environment 公开/授权日：1995-05-30
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