发明授权
- 专利标题: Pattern of apertures in a showerhead for chemical vapor deposition
- 专利标题(中): 用于化学气相沉积的喷头中的孔的图案
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申请号: US23437申请日: 1998-02-13
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公开(公告)号: US6050506A公开(公告)日: 2000-04-18
- 发明人: Xin Sheng Guo , Keith Koai , Ling Chen , Mohan K. Bhan , Bo Zheng
- 申请人: Xin Sheng Guo , Keith Koai , Ling Chen , Mohan K. Bhan , Bo Zheng
- 申请人地址: CA Santa Clara
- 专利权人: Applied Materials, Inc.
- 当前专利权人: Applied Materials, Inc.
- 当前专利权人地址: CA Santa Clara
- 主分类号: C23C16/44
- IPC分类号: C23C16/44 ; C23C16/455 ; B05B1/14
摘要:
A showerhead used for dispensing gas over a wafer in chemical vapor deposition (CVD), especially for CVD of metals. The patterns of holes is tailored to compensate for thermal and other effects, in particular by increasing the density of holes toward the periphery of the wafer in three or more zones. Such a variable pattern is particularly useful for liquid precursors that are atomized in a carrier gas, in which case a second perforated plate in back of the showerhead face can be eliminated, thereby reducing the flow impedance and the required pressure of the liquid-entrained gas, which tends to deposit out at higher pressures. The reduce flow impedance is particularly useful for CVD of copper.
公开/授权文献
- US4254464A Common data buffer system 公开/授权日:1981-03-03
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