Invention Grant
US6060685A Method for monitoring laser weld quality via plasma light intensity
measurements
失效
通过等离子体光强度测量来监测激光焊接质量的方法
- Patent Title: Method for monitoring laser weld quality via plasma light intensity measurements
- Patent Title (中): 通过等离子体光强度测量来监测激光焊接质量的方法
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Application No.: US956607Application Date: 1997-10-23
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Publication No.: US6060685APublication Date: 2000-05-09
- Inventor: Mau-Song Chou , Christopher C. Shih , Bryan W. Shirk
- Applicant: Mau-Song Chou , Christopher C. Shih , Bryan W. Shirk
- Applicant Address: CA Redondo Beach
- Assignee: TRW Inc.
- Current Assignee: TRW Inc.
- Current Assignee Address: CA Redondo Beach
- Main IPC: G01J3/443
- IPC: G01J3/443 ; B23K26/00 ; B23K26/06 ; G01N21/63 ; B23K26/02 ; B23K26/20
Abstract:
A method for monitoring the quality of a laser process such as a laser welding process includes monitoring the light emitted from the weld plasma above the surface of the workpiece irradiated by the laser beam. The intensity of the light emitted from the plasma is compared to a predetermined value of the light emission as determined under process and workpiece conditions that produce welds of acceptable quality. Variations of the monitored light intensity greater than a preselected value can be valuated as unacceptable welds. Such variations can be caused by changes in the laser beam power, the workpiece speed, laser focusing problems, insufficient shield gas flow, workpiece deformation and weld contamination. The process monitors the light emission for a selected range of wavelengths that correspond to the major emission peaks of the light spectrum. The method enables in-process control of laser processes.
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