发明授权
- 专利标题: Tomographic inspection system
- 专利标题(中): 断层扫描检查系统
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申请号: US149204申请日: 1998-09-08
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公开(公告)号: US6081580A公开(公告)日: 2000-06-27
- 发明人: Lee Grodzins , William L. Adams
- 申请人: Lee Grodzins , William L. Adams
- 申请人地址: MA Billerica
- 专利权人: American Science and Engineering, Inc.
- 当前专利权人: American Science and Engineering, Inc.
- 当前专利权人地址: MA Billerica
- 主分类号: G01N23/04
- IPC分类号: G01N23/04 ; G01V5/00 ; G01N23/201
摘要:
A tomography system for analyzing an object concealed within an enveloping surface. The system has multiple beams of penetrating radiation, each beam disposed with a distinct orientation with respect to the enveloping surface. Detectors are provided for measuring radiation backscattered by the contents of the enveloping surface and for measuring radiation transmitted through the enveloping surface. The enveloping surface is moved with respect to the multiple beams, and a timer provides for measurement of a time difference between the appearance of features in signals of respective detectors, allowing geometrical characteristics of the features to be determined and displayed.
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