发明授权
- 专利标题: Pattern formation method and surface treatment agent
- 专利标题(中): 图案形成方法和表面处理剂
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申请号: US951001申请日: 1997-10-15
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公开(公告)号: US6133465A公开(公告)日: 2000-10-17
- 发明人: Masayuki Endo , Hiromi Ohsaki
- 申请人: Masayuki Endo , Hiromi Ohsaki
- 申请人地址: JPX Osaka JPX Tokyo
- 专利权人: Matsushita Electric Industrial Co., Ltd.,Shin-Etsu Chemical Co., Ltd.
- 当前专利权人: Matsushita Electric Industrial Co., Ltd.,Shin-Etsu Chemical Co., Ltd.
- 当前专利权人地址: JPX Osaka JPX Tokyo
- 优先权: JPX8-273292 19961016; JPX9-010533 19970123
- 主分类号: G03F7/075
- IPC分类号: G03F7/075 ; C07F7/08 ; C07F7/18
摘要:
A surface of a semiconductor substrate of silicon is supplied with 4-trimethylsiloxy-3-penten-2-one serving as a surface treatment agent. Thus, H in OH groups existing on the surface of the semiconductor substrate is substituted with Si(CH.sub.3).sub.3 (i.e., a trimethylsilyl group), resulting in producing CH.sub.3 COCH.sub.2 COCH.sub.3 (i.e., acetylacetone). Then, the surface of the semiconductor substrate is coated with a resist, exposed by using a desired mask, and subjected successively to PEB and development, thereby forming a resist pattern thereon. Since the surface of the semiconductor substrate is treated with 4-trimethylsiloxy-3-penten-2-one, the surface of the semiconductor substrate is made to be hydrophobic, so that the adhesion of the semiconductor substrate can be improved. As a result, the resultant resist pattern has a satisfactory shape free from peeling.
公开/授权文献
- US5273162A Method and apparatus for separating material from a fluid 公开/授权日:1993-12-28
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