发明授权
- 专利标题: Measuring method for equivalent circuitry
- 专利标题(中): 等效电路的测量方法
-
申请号: US218108申请日: 1998-12-21
-
公开(公告)号: US6137293A公开(公告)日: 2000-10-24
- 发明人: Ruey-Beei Wu , Mei-Hua Wang
- 申请人: Ruey-Beei Wu , Mei-Hua Wang
- 申请人地址: TWX Taipei Hsien
- 专利权人: Hon Hai Precision Ind. Co., Ltd.
- 当前专利权人: Hon Hai Precision Ind. Co., Ltd.
- 当前专利权人地址: TWX Taipei Hsien
- 优先权: TWX86119475 19971219
- 主分类号: G01R27/02
- IPC分类号: G01R27/02 ; G01R27/06 ; G01R27/20 ; G01R27/26 ; G01R27/28
摘要:
A measuring method for equivalent circuitry is disclosed herein to characterize the interconnects using time-domain reflectometry measurement. By combining the layer peeling algorithm for transmission lines and the matrix-pencil approach for discontinuities, the technique yields a simple equivalent circuit model which consists of distributed transmission lines and networks of lumped elements. With element values being independent of frequency, the model is well suited to model nonlinear broadband circuit simulation for electrical performance of the interconnects.
公开/授权文献
- US4971055A Blood vessel clamp 公开/授权日:1990-11-20
信息查询