Inspecting device and its testing socket

    公开(公告)号:US11624759B1

    公开(公告)日:2023-04-11

    申请号:US17654234

    申请日:2022-03-09

    摘要: A testing socket includes a metal block, an assembly block, an analog ground probe pin and a digital ground probe pin. The metal block is formed with a concave portion and used to connect to an independent main ground. The assembly block is electrically isolated from the metal block, and detachably embedded in the recess, so that the metal block and the assembly block are assembled together to be a probe holder. The digital grounding probe is inserted in the metal block, electrically connected to the independent main ground through the metal block. The digital ground probe pin can be electrically connected to a device to be tested (DUT) and the independent main ground. The analog ground probe pin is inserted in the assembly block, and electrically connected to the DUT and another independent main ground.

    Inspection tool for a perforating gun segment

    公开(公告)号:US11578566B2

    公开(公告)日:2023-02-14

    申请号:US17159943

    申请日:2021-01-27

    摘要: An inspection tool and associated methods for testing physical and electrical properties of a perforating gun and sending the perforating gun to a wellbore site with at least one of an electrical property and a dimension that has been previously verified. The perforating gun may be received in a perforating gun holder positioned between a first connecting portion and second connecting portion. The first connecting portion may be moved from a first position to a second position at which the at least one of the electrical property and the dimension is measured. Upon verification that the at least one of the electrical property and the dimension is within a predetermined specification, the perforating gun may be sent to the wellbore site.

    EVALUATION METHOD
    4.
    发明申请

    公开(公告)号:US20210215739A1

    公开(公告)日:2021-07-15

    申请号:US17116838

    申请日:2020-12-09

    摘要: An evaluation method is a method for evaluating a charging connector in coolability by connecting an evaluation jig to the charging connector, the charging connector including a pair of male terminals coolable with a coolant, the evaluation jig including a pair of female terminals, the pair of female terminals being connected to the pair of male terminals in evaluating the charging connector in coolability. The method comprises: connecting the pair of female terminals to the pair of male terminals; adjusting a connection state between the male terminal and the female terminal such that contact resistance between the terminals is 0.06 mΩ or more and 0.15 mΩ or less; and after the adjusting, evaluating the coolability depending on whether the male and female terminals have a temperature of 90° C. or lower when a charging current of 400 A is supplied to the terminals for 30 minutes.

    Monitoring circuitry
    5.
    发明授权

    公开(公告)号:US11016131B2

    公开(公告)日:2021-05-25

    申请号:US16072969

    申请日:2016-04-29

    申请人: HP INDIGO B.V.

    发明人: Gideon Amir

    摘要: In an example, monitoring circuitry includes a first and a second coupling to electrically connect the monitoring circuitry to a monitored circuit having a resistance. The resistance of the monitored circuit may be indicative of a status, and the monitored circuit may be connected in series between the first and second coupling. The first coupling comprises a plurality of galvanically separated connection elements which are to form an electrical connection with a common connection element of the monitored circuit. The monitoring circuitry further comprises a monitoring apparatus to determine the resistance of the monitored circuit via the first coupling and the second coupling. The monitoring apparatus is to acquire a plurality of electrical values and to use the plurality of electrical values to determine a value of the resistance of the monitored circuit.

    Cleaning methods for probe cards
    7.
    发明授权

    公开(公告)号:US10921358B2

    公开(公告)日:2021-02-16

    申请号:US16526573

    申请日:2019-07-30

    发明人: Chih-Chiang Lai

    IPC分类号: G01R27/20 B08B7/00 G01R1/073

    摘要: A testing system for testing a device under test including a plurality of circuits under test includes a probe card, testing apparatus, and a controller. The probe card includes a plurality of probes temporarily coupled to the circuits under test. The testing apparatus holds the probe card and tests the circuits under test through tine probe card. The controller controls the testing apparatus and executes a testing procedure that includes: measuring the contact resistance values between the probe card and each of the circuits under test; determining a statistical value of the contact resistance values; determining whether the statistical value exceeds a first threshold; when the statistical value does not exceed the first threshold, setting a clean flag to be in a first state; otherwise, setting the clean flag to be in a second state; and performing a clean operation on the probes according to the clean flag.

    System and Method for Electric Current Leakage Detection in A Land Seismic System

    公开(公告)号:US20190072610A1

    公开(公告)日:2019-03-07

    申请号:US16083512

    申请日:2017-03-15

    申请人: WESTERNGECO LLC

    摘要: Embodiments disclosed herein are directed towards systems and methods for electric current leakage detection in a land seismic system. Embodiments may include generating at least one test signal using a digital to analog converter “DAC” circuitry, wherein the DAC circuitry includes an output operatively connected to earth ground. Embodiments may further include alternately grounding a positive path to an analog to digital converter “ADC” circuitry during a first time window and a negative path to the analog to digital converter during a second time window while measuring an ADC signal. Embodiments may also include determining an average amplitude of the first time window and the second time window and determining a leakage resistance based upon, at least in part, the average amplitude of the first time window and the second time window.

    DISPLAY DEVICE
    10.
    发明申请
    DISPLAY DEVICE 审中-公开

    公开(公告)号:US20190064239A1

    公开(公告)日:2019-02-28

    申请号:US15978975

    申请日:2018-05-14

    IPC分类号: G01R27/20 G01R31/04 G09G3/00

    摘要: A display device including a first substrate including a display area and a non-display area, a circuit film connected to the first substrate, a printed circuit board (PCB) connected to the circuit film, and a first inspection pad, a second inspection pad, and a third inspection pad located in the non-display area and a bridge configured to electrically connect the first inspection pad, the second inspection pad, and the third inspection pad. The circuit film includes a first line electrically connected to the first inspection pad, a second line electrically connected to the second inspection pad, a third line electrically connected to the third inspection pad, and a branch point configured to branch at least one line from the first line, the second line, and the third line into two sub-lines. The PCB includes a test pad unit connected to the first line, the second line, and the third line.