发明授权
- 专利标题: Selective removal of etching residues
- 专利标题(中): 选择性去除蚀刻残留物
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申请号: US969593申请日: 1997-11-13
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公开(公告)号: US6150282A公开(公告)日: 2000-11-21
- 发明人: David L. Rath , Rangarajan Jagannathan , Kenneth J. McCullough , Harald F. Okorn-Schmidt , Karen P. Madden , Keith R. Pope
- 申请人: David L. Rath , Rangarajan Jagannathan , Kenneth J. McCullough , Harald F. Okorn-Schmidt , Karen P. Madden , Keith R. Pope
- 申请人地址: NY Armonk
- 专利权人: International Business Machines Corporation
- 当前专利权人: International Business Machines Corporation
- 当前专利权人地址: NY Armonk
- 主分类号: H01L21/306
- IPC分类号: H01L21/306 ; H01L21/768 ; H01L21/302
摘要:
Etching residue is selectively removed employing a substantially non-aqueous composition containing a fluoride containing compound and certain organic solvents. Preferred compositions also include an anhydride.