发明授权
US06204506B1 Back illuminated photodetector and method of fabricating the same 失效
背光照明光电探测器及其制造方法

  • 专利标题: Back illuminated photodetector and method of fabricating the same
  • 专利标题(中): 背光照明光电探测器及其制造方法
  • 申请号: US09092014
    申请日: 1998-06-04
  • 公开(公告)号: US06204506B1
    公开(公告)日: 2001-03-20
  • 发明人: Hiroshi AkahoriMasaharu Muramatsu
  • 申请人: Hiroshi AkahoriMasaharu Muramatsu
  • 优先权: JP9-147992 19970605
  • 主分类号: H01L2978
  • IPC分类号: H01L2978
Back illuminated photodetector and method of fabricating the same
摘要:
An n-type buried channel, a silicon oxide film, a poly-Si transfer electrode, a PSG film as an insulating interlayer, an aluminum interconnection, and a silicon nitride film are stacked on one surface of a p-type silicon substrate to form a CCD. The other surface is protected by a silicon oxide film, and a p+-type accumulation layer is formed on the silicon oxide film, thereby forming a back-illuminated CCD on which light, electromagnetic wave, charged particles, or the like is incident through the other surface. A glass substrate is anodically bonded on the CCD via an insulating polyimide film, and a conductive aluminum film. Therefore, the mechanical strength of the device is kept high, and the sensitivity can be increased by thinning the silicon substrate.
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