发明授权
- 专利标题: Method for fabricating reliable multilayer bottom electrode for ferroelectric capacitors
- 专利标题(中): 制造可靠的铁电电容器多层底电极的方法
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申请号: US09231023申请日: 1999-01-14
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公开(公告)号: US06238932B1公开(公告)日: 2001-05-29
- 发明人: Katsuhiro Aoki , Tomoyuki Sakoda , Yukio Fukuda
- 申请人: Katsuhiro Aoki , Tomoyuki Sakoda , Yukio Fukuda
- 主分类号: H01E706
- IPC分类号: H01E706
摘要:
A ferroelectric capacitor electrode contact structure comprising an insulator (4) placed over a substrate (2) and containing a transistor source (6) and transistor drain (8) between the substrate (2) and the insulator (4). The insulator (4) contains a source plug (10) and a conductive drain plug (12). The transistor source (6) is electrically connected to the source plug (10). The transistor drain (8) is electrically connected to the conductive drain plug (12). A transistor gate (14) is between the source plug (10) and a conductive drain plug (12) and is contained by the insulator (4). Metal wiring (16) is electrically connected to the source plug (10). A barrier film (18) is placed over the insulator (4) and the conductive drain plug (12). The bottom electrode (20) is placed over the barrier film (18). The ferroelectric layer (22) is placed over the bottom electrode (20). The top electrode (24) is placed over the ferroelectric layer (22).
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