发明授权
- 专利标题: Power transistor with silicided gate and contacts
- 专利标题(中): 功率晶体管采用硅化栅和触点
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申请号: US09168194申请日: 1998-10-07
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公开(公告)号: US06284669B1公开(公告)日: 2001-09-04
- 发明人: John P. Erdeljac , Louis N. Hutter , Jeffrey P. Smith , Han-Tzong Yuan , Jau-Yuann Yang , Taylor R. Efland , C. Matthew Thompson , John K. Arch , Mary Ann Murphy
- 申请人: John P. Erdeljac , Louis N. Hutter , Jeffrey P. Smith , Han-Tzong Yuan , Jau-Yuann Yang , Taylor R. Efland , C. Matthew Thompson , John K. Arch , Mary Ann Murphy
- 主分类号: H01L21302
- IPC分类号: H01L21302
摘要:
A power field effect transistor is disclosed that includes polysilicon gate bodies (40) and (42), which includes platinum silicide contact layers (74) and (78) disposed on the outer surfaces of bodies (40) and (42), respectively. In addition, the device comprises an n+drain region (64) which also has a platinum silicide drain contact layer (76) formed on its outer surface and platinum silicide source contact layers (75) and (77). During formation, sidewall spacers (50) and (52), as well as mask bodies (70) and (72) are used to ensure that platinum silicide layer (76) spaced apart from both gate bodies (40) and (42) and platinum silicide gate contact layers (74) and (78).
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