发明授权
US06301167B1 Apparatus for testing semiconductor memory 有权
半导体存储器测试装置

Apparatus for testing semiconductor memory
摘要:
An apparatus for testing a semiconductor memory is disclosed, which includes a power control module for varying an output voltage of the power supply unit and supplying to the semiconductor memory in accordance with a power control signal from a CPU(Central Processing Unit) of the main board, and an interface unit for supplying the power control signal from the CPU of the main board to the power control module, thus implementing an accurate operation state of an actual mounting environment of a semiconductor memory device by varying and supplying a certain voltage supplied from a power supply unit when testing whether a semiconductor memory device is defective or not using a main board of a computer apparatus.
信息查询
0/0