发明授权
- 专利标题: Apparatus for testing semiconductor memory
- 专利标题(中): 半导体存储器测试装置
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申请号: US09638385申请日: 2000-08-12
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公开(公告)号: US06301167B1公开(公告)日: 2001-10-09
- 发明人: Ill Young Lee , Sang Sik Lee , Jong Hyun Kim , Duk Chun Park , Byung Soo Ham , Byung Koo Ham
- 申请人: Ill Young Lee , Sang Sik Lee , Jong Hyun Kim , Duk Chun Park , Byung Soo Ham , Byung Koo Ham
- 优先权: KR2000-22344 20000427
- 主分类号: G11C700
- IPC分类号: G11C700
摘要:
An apparatus for testing a semiconductor memory is disclosed, which includes a power control module for varying an output voltage of the power supply unit and supplying to the semiconductor memory in accordance with a power control signal from a CPU(Central Processing Unit) of the main board, and an interface unit for supplying the power control signal from the CPU of the main board to the power control module, thus implementing an accurate operation state of an actual mounting environment of a semiconductor memory device by varying and supplying a certain voltage supplied from a power supply unit when testing whether a semiconductor memory device is defective or not using a main board of a computer apparatus.
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