发明授权
- 专利标题: Photogrammetric analytical measurement system
- 专利标题(中): 摄影测量分析测量系统
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申请号: US09188329申请日: 1998-11-09
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公开(公告)号: US06304669B1公开(公告)日: 2001-10-16
- 发明人: Atsumi Kaneko , Masato Hara , Toshihiro Nakayama , Atsushi Kida , Shigeru Wakashiro
- 申请人: Atsumi Kaneko , Masato Hara , Toshihiro Nakayama , Atsushi Kida , Shigeru Wakashiro
- 优先权: JP9-323735 19971110
- 主分类号: G06K900
- IPC分类号: G06K900
摘要:
A photogrammetric measurement system produces a survey map based on a set of photographed pictures obtained at two different photographing positions. Each of the pictures includes at least one continuous line and at least three conspicuous points away from the continuous line, with at least one of the conspicuous points and remaining conspicuous points being placed at opposing sides of the continuous line. The set of pictures are produced as a first picture and a second picture. First lines are produced between the conspicuous points on the first picture such that the lines intersect the continuous line, thereby generating intersecting points. Second lines are produced between the conspicuous points on the second picture such that the lines intersect the continuous line, thereby generating further intersecting points. A set of corresponding intersecting points are designated on the first and second pictures, and intersecting points are produced on the survey map based on the designated corresponding intersecting points. A line, connecting the intersecting points, is thus produced on the survey map.
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